Center for Electron Microscopy and Microanalysis
In Association with:


The JSM-6610LV low vacuum SEM is equipped with a tungsten filament, large chamber for observation of specimens up to 200mm in diameter and a point-to-point resolution of 3 nm at 30kV in high vacuum mode. The selectable Low Vacuum mode allows for observation of specimens that cannot be viewed at high vacuum due to excessive water content or due to a non-conductive surface. Outfitted with an EDAX energy dispersive X-ray spectrometer (EDS) which has a Sapphire Si(Li) detecting unit, 10mm2 detector crystal and genesis software.

Primary Contact :
John Curulli
curulli at
(213) 740-1990

Secondary Contact :
Ian McFarlane - Life Science
imcfarla at

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