Center for Electron Microscopy and Microanalysis
In Association with:

MULTBEAM JIB 4500 MULTIBEAM FOCUSED ION BEAM

The JIB-4500 is a high performance LaB6 SEM with Ga liquid metal ion source FIB. It is equipped with EDAX energy dispersive X-ray spectrometer (EDS) and Omniprobe AutoProbe 200 in situ TEM lift-out and Omniprobe OmniGIS gas injector system.


Primary Contact :
John Curulli
curulli at usc.edu
(213) 740-1990

Secondary Contact :
Yuzheng Zhang - Physical Science
imcfarla at usc.edu


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