The JSM-7001F-LV is an analytical field emission scanning electron microscope equipped with imaging detectors for secondary and backscattered electrons it has analytical detectors for electron backscatter diffraction (EBSD) and energy dispersive X-ray spectrometer (EDS). The low vacuum mode can be used for imaging of untreated non-conductive specimens.
curulli at usc.edu
Ian McFarlane - Life Science
imcfarla at usc.edu
Yuzheng Zhang - Physical Science
yuzhengz at usc.edu