Center for Electron Microscopy and Microanalysis
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JSM 7001F LOW-VACCUM FIELD EMISSION SCANNING ELECTRON MICROSCOPE

The JSM-7001F-LV is an analytical field emission scanning electron microscope equipped with imaging detectors for secondary and backscattered electrons it has analytical detectors for electron backscatter diffraction (EBSD) and energy dispersive X-ray spectrometer (EDS). The low vacuum mode can be used for imaging of untreated non-conductive specimens.



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