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| JSM-7001F Key Product Features |
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Resolution
(secondary electron image) |
1.2 nm (at 30 kV)
3.0 nm (at 1.0 kV)
3.0 nm (at 15 kV 10mm WD, 5nA) |
| Accelerating Voltage |
0.5 to 2.9 kV (10V steps)
3.0 to 30 kV (100V steps) |
| Magnification |
x10 to 1,000,000x |
| Imaging Modes |
SEI (secondary electron image)
BEI - Option (backscattered electron image TOPO and COMPO) |
| Specimen Stage |
Mechanically eucentric at all WDs
Type I
X=70mm, Y=50mm, Z=38mm (WD 3 to 41mm)
T=-5 to 70° R=360° (4" diameter coverage)
Type II
X=110mm, Y=80mm, Z=38mm (WD 3 to 41mm)
T=-5 to 60° R=360° (6" diameter coverage)
Type III
X=140mm, Y=80mm
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| Specimen Exchange Airlock |
6" x 10mm
4" x 40mm |
| Operation & Display System |
For observation: 20", high resolution FPD
Easy to use Windows® XP based automation system |
| Image Resolution |
800 x 600 pixels, 1280 x 1024 pixels, 2560 x 1920 pixels, 5129 x 3840 pixels (16 bit TIFF) |
| On Screen Measurement |
Horizontal, vertical, diagonal, point to point, angles |
| Image Processing |
Gamma, Brightness & contrast, Kernal Filters, Image Annotation,
False Color, Thumbnails |
| Image Selector |
SEI, COMPO, TOPO, EDS, ADD, Auxiliary Input |
| Image Database |
Image archiving, searching, % area fraction, custom report generation, montaging, image filtering, annotation, brightness & contrast adjustment |
| Auto Functions |
AFD (Auto Focus)
ACB (Auto Contrast and Brightness Control)
ASD (Auto Stigmator)
AFD ACB
Auto Photo |
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