Center for Electron Microscopy and Microanalysis
In Association with:

OMX

The GE DeltaVision OMX system is an optical-sectioning epifluorescence microscope capable of operating in 3D-SIM, TIRF or widefield-deconvolution mode with the option of stage/sample heating, CO2 capabilities and live-cell observations. In most applications sample preparation/engineering is "nearly" identical to conventional light microscopy.

Excitation lines include 405, 445, 488, 514, 568, 642nm; multiplexing up to 4 colors is possible. 3 sCMOS cameras provide good sensitivity with near simultaneous acquisition. Speed in 3D-SIM mode is enhanced by the "Blaze" light path which manipulates the structured illumination pattern without moving a physical grid and allows wavelength specific pattern spacing. In super-resolution 3D-SIM mode the resolution that can be achieved is 120nm in the x-y direction and 300nm in the z direction.


Primary Contact :
Marc Green
marcgree at usc.edu

Secondary Contact :
John Curulli
curulli at usc.edu
(213)-740-1990


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